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Homepage>BS EN 62374-1:2010 Semiconductor devices Time-dependent dielectric breakdown (TDDB) test for inter-metal layers

BS EN 62374-1:2010

Semiconductor devices Time-dependent dielectric breakdown (TDDB) test for inter-metal layers

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Označení normy:	BS EN 62374-1:2010
Počet stran:	20
Vydáno:	2011-06-30
ISBN:	978 0 580 75206 3
Status:	Standard

DESCRIPTION

BS EN 62374-1:2010

This standard BS EN 62374-1:2010 Semiconductor devices is classified in these ICS categories:

43.040.20 Lighting, signalling and warning devices
29.140.20 Incandescent lamps
31.080.01 Semiconductor devices in general

This part of IEC 62374 describes a test method, test structure and lifetime estimation method of the time-dependent dielectric breakdown (TDDB) test for inter-metal layers applied in semiconductor devices.

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