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Homepage>BS EN 62416:2010 Semiconductor devices. Hot carrier test on MOS transistors

BS EN 62416:2010

Semiconductor devices. Hot carrier test on MOS transistors

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Označení normy:	BS EN 62416:2010
Počet stran:	14
Vydáno:	2010-07-31
ISBN:	978 0 580 58621 7
Status:	Standard

DESCRIPTION

BS EN 62416:2010

This standard BS EN 62416:2010 Semiconductor devices. Hot carrier test on MOS transistors is classified in these ICS categories:

31.080.30 Transistors

This standard describes the wafer level hot carrier test on NMOS and PMOS transistors. The test is intended to determine whether the single transistors in a certain (C)MOS process meet the required hot carrier lifetime.

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