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Homepage>BS EN IEC 60749-12:2018 Semiconductor devices. Mechanical and climatic test methods Vibration, variable frequency

BS EN IEC 60749-12:2018

Semiconductor devices. Mechanical and climatic test methods Vibration, variable frequency

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Označení normy:	BS EN IEC 60749-12:2018
Počet stran:	12
Vydáno:	2018-04-18
ISBN:	978 0 580 98682 6
Status:	Standard

DESCRIPTION

BS EN IEC 60749-12:2018

This standard BS EN IEC 60749-12:2018 Semiconductor devices. Mechanical and climatic test methods is classified in these ICS categories:

31.080.01 Semiconductor devices in general

This part of IEC 60749 describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It is normally applicable to cavity-type packages.

NOTE This test method describes a swept sine test. A random vibration test is described in JEDEC document JESD 22-B103.

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