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sklademVydáno: 2018-04-30
BS EN IEC 60749-13:2018
Semiconductor devices. Mechanical and climatic test methods Salt atmosphere
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| Označení normy: | BS EN IEC 60749-13:2018 |
| Počet stran: | 20 |
| Vydáno: | 2018-04-30 |
| ISBN: | 978 0 580 98422 8 |
| Status: | Standard |
DESCRIPTION
BS EN IEC 60749-13:2018
This standard BS EN IEC 60749-13:2018 Semiconductor devices. Mechanical and climatic test methods is classified in these ICS categories:
- 31.080.01 Semiconductor devices in general
This PART of IEC 60749 describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment.
The salt atmosphere test is considered destructive.