Log inSign up
LANGUAGE czen
Menu
ContactSTOREFAQE-ReadingNews
SEARCH
0
Total price
0 €
PRICES include / exclude VAT
Homepage>BS EN IEC 60749-26:2018 - TC Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)
Sponsored link
sklademVydáno: 2020-02-27
BS EN IEC 60749-26:2018 - TC Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)

BS EN IEC 60749-26:2018 - TC

Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)

Format
Availability
Price and currency
Anglicky Secure PDF
Immediate download
496.39 €
Anglicky Hardcopy
In stock
496.39 €
Označení normy:BS EN IEC 60749-26:2018 - TC
Vydáno:2020-02-27
ISBN:978 0 539 11726 4
Status:Tracked Changes
DESCRIPTION

BS EN IEC 60749-26:2018 - TC


This standard BS EN IEC 60749-26:2018 - TC Tracked Changes. Semiconductor devices. Mechanical and climatic test methods is classified in these ICS categories:
  • 31.080.01 Semiconductor devices in general

Print