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Homepage>BS EN IEC 60749-41:2020 Semiconductor devices. Mechanical and climatic test methods Standard reliability testing methods of non-volatile memory devices

BS EN IEC 60749-41:2020

Semiconductor devices. Mechanical and climatic test methods Standard reliability testing methods of non-volatile memory devices

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Označení normy:	BS EN IEC 60749-41:2020
Počet stran:	26
Vydáno:	2020-09-09
ISBN:	978 0 580 96287 5
Status:	Standard

DESCRIPTION

BS EN IEC 60749-41:2020

This standard BS EN IEC 60749-41:2020 Semiconductor devices. Mechanical and climatic test methods is classified in these ICS categories:

31.080.01 Semiconductor devices in general

This Part of IEC 60749 specifies the procedural requirements for performing valid endurance, retention and cross-temperature tests based on a qualification specification. Endurance and retention qualification specifications (for cycle counts, durations, temperatures, and sample sizes) are specified in JESD47 or are developed using knowledge-based methods such as in JESD94.

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