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BS EN IEC 60749-41:2020
Semiconductor devices. Mechanical and climatic test methods Standard reliability testing methods of non-volatile memory devices
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| Označení normy: | BS EN IEC 60749-41:2020 |
| Počet stran: | 26 |
| Vydáno: | 2020-09-09 |
| ISBN: | 978 0 580 96287 5 |
| Status: | Standard |
DESCRIPTION
BS EN IEC 60749-41:2020
This standard BS EN IEC 60749-41:2020 Semiconductor devices. Mechanical and climatic test methods is classified in these ICS categories:
- 31.080.01 Semiconductor devices in general
This Part of IEC 60749 specifies the procedural requirements for performing valid endurance, retention and cross-temperature tests based on a qualification specification. Endurance and retention qualification specifications (for cycle counts, durations, temperatures, and sample sizes) are specified in JESD47 or are developed using knowledge-based methods such as in JESD94.