Menu
0
Total price
0 €
PRICES include / exclude VAT
Homepage>BS EN IEC 61788-17:2021 Superconductivity Electronic characteristic measurements. Local critical current density and its distribution in large-area superconducting films
Sponsored link
sklademVydáno: 2021-06-16
BS EN IEC 61788-17:2021 Superconductivity Electronic characteristic measurements. Local critical current density and its distribution in large-area superconducting films

BS EN IEC 61788-17:2021

Superconductivity Electronic characteristic measurements. Local critical current density and its distribution in large-area superconducting films

Format
Availability
Price and currency
Anglicky Secure PDF
Immediate download
337.78 €
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standard
for 1 hour
33.78 €
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standard
for 24 hours
101.33 €
Anglicky Hardcopy
In stock
337.78 €
Označení normy:BS EN IEC 61788-17:2021
Počet stran:48
Vydáno:2021-06-16
ISBN:978 0 539 03980 1
Status:Standard
DESCRIPTION

BS EN IEC 61788-17:2021


This standard BS EN IEC 61788-17:2021 Superconductivity is classified in these ICS categories:
  • 91.140.50 Electricity supply systems
  • 35.110 Networking
  • 17.220.01 Electricity. Magnetism. General aspects
  • 17.220.20 Measurement of electrical and magnetic quantities
  • 29.050 Superconductivity and conducting materials
IEC 61788-17:2021 is available as IEC 61788-17:2021 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.

IEC 61788-17:2021 specifies the measurements of the local critical current density (Jc) and its distribution in large-area high-temperature superconducting (HTS) films by an inductive method using third-harmonic voltages. The most important consideration for precise measurements is to determine Jc at liquid nitrogen temperatures by an electric-field criterion and obtain current-voltage characteristics from its frequency dependence. Although it is possible to measure Jc in applied DC magnetic fields [20] [21], the scope of this document is limited to the measurement without DC magnetic fields. This technique intrinsically measures the critical sheet current that is the product of Jc and the film thickness d. The range and measurement resolution for Jcd of HTS films are as follows. - Jcd: from 200 A/m to 32 kA/m (based on results, not limitation). - Measurement resolution: 100 A/m (based on results, not limitation).