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BS IEC 60747-14-11:2021
Semiconductor devices Semiconductor sensors. Test method of surface acoustic wave-based integrated sensors for measuring ultraviolet, illumination and temperature
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| Označení normy: | BS IEC 60747-14-11:2021 |
| Počet stran: | 24 |
| Vydáno: | 2021-03-12 |
| ISBN: | 978 0 580 98982 7 |
| Status: | Standard |
DESCRIPTION
BS IEC 60747-14-11:2021
This standard BS IEC 60747-14-11:2021 Semiconductor devices is classified in these ICS categories:
- 31.080.01 Semiconductor devices in general
This part of IEC 60747 defines the terms, definitions, configuration, and test methods can be used to evaluate and determine the performance characteristics of surface acoustic wavebased semiconductor sensors integrated with ultraviolet, illuminance, and temperature sensors. The measurement methods are for DC characteristics and RF characteristics, and the measurement method for RF characteristics includes a direct mode and differential amplifier mode based on feedback oscillation. This document excludes devices dealt with by TC 49: piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection.