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Homepage>BS IEC 62047-28:2017 Semiconductor devices. Micro-electromechanical devices Performance testing method of vibration-driven MEMS electret energy harvesting devices
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sklademVydáno: 2020-07-22
BS IEC 62047-28:2017 Semiconductor devices. Micro-electromechanical devices Performance testing method of vibration-driven MEMS electret energy harvesting devices

BS IEC 62047-28:2017

Semiconductor devices. Micro-electromechanical devices Performance testing method of vibration-driven MEMS electret energy harvesting devices

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Označení normy:BS IEC 62047-28:2017
Počet stran:20
Vydáno:2020-07-22
ISBN:978 0 580 90198 0
Status:Standard
DESCRIPTION

BS IEC 62047-28:2017


This standard BS IEC 62047-28:2017 Semiconductor devices. Micro-electromechanical devices is classified in these ICS categories:
  • 31.080.99 Other semiconductor devices
IEC 62047-28:2017(E) specifies terms and definitions, and a performance testing method of vibration driven MEMS electret energy harvesting devices to determine the characteristic parameters for consumer, industry or any application.
This document applies to vibration driven electret energy harvesting devices whose electrodes with a gap below 1 000 ?m are covered by dielectric material with trapped charges and are fabricated by MEMS processes such as etching, photolithography or deposition.
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