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Homepage>BS IEC 62047-34:2019 Semiconductor devices. Micro-electromechanical devices Test methods for MEMS piezoresistive pressure-sensitive device on wafer

sklademVydáno: 2019-04-16

BS IEC 62047-34:2019

Semiconductor devices. Micro-electromechanical devices Test methods for MEMS piezoresistive pressure-sensitive device on wafer

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Označení normy:	BS IEC 62047-34:2019
Počet stran:	20
Vydáno:	2019-04-16
ISBN:	978 0 580 97391 8
Status:	Standard

DESCRIPTION

BS IEC 62047-34:2019

This standard BS IEC 62047-34:2019 Semiconductor devices. Micro-electromechanical devices is classified in these ICS categories:

31.140 Piezoelectric devices
31.080.99 Other semiconductor devices

IEC 62047-34:2019 (E) describes test conditions and test methods of electric character, static performances and thermal performances for MEMS pressure-sensitive devices. This document applies to test for both open and closed loop piezoresistive MEMS pressure devices on wafer.

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