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Homepage>BS IEC 62047-43:2024 Semiconductor devices. Micro-electromechanical devices Test method of electrical characteristics after cyclic bending deformation for flexible micro-electromechanical devices
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sklademVydáno: 2024-03-22
BS IEC 62047-43:2024 Semiconductor devices. Micro-electromechanical devices Test method of electrical characteristics after cyclic bending deformation for flexible micro-electromechanical devices

BS IEC 62047-43:2024

Semiconductor devices. Micro-electromechanical devices Test method of electrical characteristics after cyclic bending deformation for flexible micro-electromechanical devices

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Označení normy:BS IEC 62047-43:2024
Počet stran:22
Vydáno:2024-03-22
ISBN:978 0 539 17665 0
Status:Standard
DESCRIPTION

BS IEC 62047-43:2024


This standard BS IEC 62047-43:2024 Semiconductor devices. Micro-electromechanical devices is classified in these ICS categories:
  • 31.080.99 Other semiconductor devices