This standard BS IEC 62525:2007 Standard test interface language (STIL) for digital test vector data is classified in these ICS categories:
19.080 Electrical and electronic testing
35.060 Languages used in information technology
25.040.01 Industrial automation systems in general
Defines a test description language that: Facilitates the transfer of large volumes of digital test vector data from CAE environments to automated test equipment ATE environments; Specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a device under test (DUT); Supports the volume of test vector data generated from structured tests such as scan/automatic test pattern generation (ATPG), integral test techniques such as built-in self test (BIST), and functional test specifications for IC designs and their assemblies, in a format optimized for application in ATE environments.
