PRICES include / exclude VAT

Homepage>BS IEC 62526:2007 Standard for extensions to standard test interface language (STIL) for semiconductor design environments

sklademVydáno: 2007-12-31

BS IEC 62526:2007

Standard for extensions to standard test interface language (STIL) for semiconductor design environments

Anglicky Secure PDF

Immediate download

373.88 €

You can read the standard for 1 hour. More information in the category: E-reading

Reading the standard

for 1 hour

37.39 €

You can read the standard for 24 hours. More information in the category: E-reading

Reading the standard

for 24 hours

112.16 €

Anglicky Hardcopy

In stock

373.88 €

Označení normy:	BS IEC 62526:2007
Počet stran:	124
Vydáno:	2007-12-31
ISBN:	978 0 580 59314 7
Status:	Standard

DESCRIPTION

BS IEC 62526:2007

This standard BS IEC 62526:2007 Standard for extensions to standard test interface language (STIL) for semiconductor design environments is classified in these ICS categories:

25.040.01 Industrial automation systems in general
35.060 Languages used in information technology

Provides an interface between digital test generation tools and test equipment. A test description language is defined that:(a) facilitates the transfer of digital test vector data from CAE to ATE environments;(b) specifies patten, format, and timing information sufficant to define the application of digital test vectors to a DUT;and (c) supports the volume of test vector data generated from structured tests.

Print RECOMMEND