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Homepage>BS IEC 62899-503-1:2020 Printed electronics Quality assessment. Test method of displacement current measurement for printed thin-film transistor

BS IEC 62899-503-1:2020

Printed electronics Quality assessment. Test method of displacement current measurement for printed thin-film transistor

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Označení normy:	BS IEC 62899-503-1:2020
Počet stran:	18
Vydáno:	2020-09-25
ISBN:	978 0 580 97380 2
Status:	Standard

DESCRIPTION

BS IEC 62899-503-1:2020

This standard BS IEC 62899-503-1:2020 Printed electronics is classified in these ICS categories:

29.045 Semiconducting materials
31.080.30 Transistors

IEC 62899-503-1:2020(E) specifies a test method for displacement current measurement (DCM) for printed thin film transistors (TFTs) or organic thin film transistors (OTFTs).

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