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Homepage>BS IEC 63003:2015 Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505<sup>TM</sup>
sklademVydáno: 2016-01-31
BS IEC 63003:2015 Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505<sup>TM</sup>

BS IEC 63003:2015

Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505<sup>TM</sup>

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Označení normy:BS IEC 63003:2015
Počet stran:174
Vydáno:2016-01-31
ISBN:978 0 580 91106 4
Status:Standard
DESCRIPTION

BS IEC 63003:2015


This standard BS IEC 63003:2015 Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505TM is classified in these ICS categories:
  • 25.040.01 Industrial automation systems in general

The scope of this standard is the definition of a pin map utilizing the IEEE 1505™ 1 receiver fixture interface (RFI). The pin map defined within this standard shall apply to military and aerospace automatic test equipment (ATE) testing applications.