Homepage>BS IEC 63150-1:2019 Semiconductor devices. Measurement and evaluation methods of kinetic energy harvesting devices under practical vibration environment Arbitrary and random mechanical vibrations
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sklademVydáno: 2023-04-13
BS IEC 63150-1:2019
Semiconductor devices. Measurement and evaluation methods of kinetic energy harvesting devices under practical vibration environment Arbitrary and random mechanical vibrations
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This standard BS IEC 63150-1:2019 Semiconductor devices. Measurement and evaluation methods of kinetic energy harvesting devices under practical vibration environment is classified in these ICS categories:
31.080.99 Other semiconductor devices
IEC 63150-1:2019 specifies terms and definitions, and test methods for kinetic energy harvesting devices for one-dimensional mechanical vibrations to determine the characteristic parameters under a practical vibration environment. Such vibration energy harvesting devices often have their own non-linear mechanisms to efficiently capture vibration energy in a broadband frequency range. This document is applicable to vibration energy harvesting devices with different power generation principles (such as electromagnetic, piezoelectric, electrostatic, etc.) and with different non-linear behaviour to the external mechanical excitation.