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sklademVydáno: 2022-11-11
BS IEC 63284:2022
Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors
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| Označení normy: | BS IEC 63284:2022 |
| Počet stran: | 16 |
| Vydáno: | 2022-11-11 |
| ISBN: | 978 0 539 12643 3 |
| Status: | Standard |
DESCRIPTION
BS IEC 63284:2022
This standard BS IEC 63284:2022 Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors is classified in these ICS categories:
- 31.080.30 Transistors
- 31.080.01 Semiconductor devices in general
- 31.080.99 Other semiconductor devices