PRICES include / exclude VAT

Homepage>BS IEC 63284:2022 Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors

BS IEC 63284:2022

Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors

Anglicky Secure PDF

Immediate download

194.33 €

You can read the standard for 1 hour. More information in the category: E-reading

Reading the standard

for 1 hour

19.43 €

You can read the standard for 24 hours. More information in the category: E-reading

Reading the standard

for 24 hours

58.30 €

Anglicky Hardcopy

In stock

194.33 €

Označení normy:	BS IEC 63284:2022
Počet stran:	16
Vydáno:	2022-11-11
ISBN:	978 0 539 12643 3
Status:	Standard

DESCRIPTION

BS IEC 63284:2022

This standard BS IEC 63284:2022 Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors is classified in these ICS categories:

31.080.30 Transistors
31.080.01 Semiconductor devices in general
31.080.99 Other semiconductor devices

Print RECOMMEND