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Homepage>BS IEC 63284:2022 Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors

BS IEC 63284:2022

Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors

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Označení normy:	BS IEC 63284:2022
Počet stran:	16
Vydáno:	2022-11-11
ISBN:	978 0 539 12643 3
Status:	Standard

DESCRIPTION

BS IEC 63284:2022

This standard BS IEC 63284:2022 Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors is classified in these ICS categories:

31.080.30 Transistors
31.080.01 Semiconductor devices in general
31.080.99 Other semiconductor devices

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