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sklademVydáno: 2023-02-15
BS ISO 14606:2022
Surface chemical analysis. Sputter depth profiling. Optimization using layered systems as reference materials
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| Označení normy: | BS ISO 14606:2022 |
| Počet stran: | 26 |
| Vydáno: | 2023-02-15 |
| ISBN: | 978 0 539 18359 7 |
| Status: | Standard |
DESCRIPTION
BS ISO 14606:2022
This standard BS ISO 14606:2022 Surface chemical analysis. Sputter depth profiling. Optimization using layered systems as reference materials is classified in these ICS categories:
- 71.040.40 Chemical analysis