Log inSign up
LANGUAGE czen
Menu
ContactSTOREFAQE-ReadingNews
SEARCH
0
Total price
0 €
PRICES include / exclude VAT
Homepage>BS ISO 14606:2022 Surface chemical analysis. Sputter depth profiling. Optimization using layered systems as reference materials
Sponsored link
sklademVydáno: 2023-02-15
BS ISO 14606:2022 Surface chemical analysis. Sputter depth profiling. Optimization using layered systems as reference materials

BS ISO 14606:2022

Surface chemical analysis. Sputter depth profiling. Optimization using layered systems as reference materials

Format
Availability
Price and currency
Anglicky Secure PDF
Immediate download
263.89 €
Anglicky Hardcopy
In stock
263.89 €
Označení normy:BS ISO 14606:2022
Počet stran:26
Vydáno:2023-02-15
ISBN:978 0 539 18359 7
Status:Standard
DESCRIPTION

BS ISO 14606:2022


This standard BS ISO 14606:2022 Surface chemical analysis. Sputter depth profiling. Optimization using layered systems as reference materials is classified in these ICS categories:
  • 71.040.40 Chemical analysis

Print