Vážení zákazníci, v letošním roce budeme expedovat poslední objednávky ve středu 18. 12. 2024.

Těšíme se s vámi na shledanou od pondělí 06. 01. 2025.

 

Log inSign up
LANGUAGE czen
Menu
ContactSTOREFAQInfobarE-ReadingNews
SEARCH
0
Total price
0 €
PRICES include / exclude VAT
Homepage>BS ISO 16700:2016 - TC Tracked Changes. Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification
Sponsored link
sklademVydáno: 2020-02-26
BS ISO 16700:2016 - TC Tracked Changes. Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification

BS ISO 16700:2016 - TC

Tracked Changes. Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification

Format
Availability
Price and currency
Anglicky Secure PDF
Immediate download
380.17 €
Anglicky Hardcopy
In stock
380.17 €
Označení normy:BS ISO 16700:2016 - TC
Počet stran:58
Vydáno:2020-02-26
ISBN:978 0 539 10715 9
Status:Tracked Changes
DESCRIPTION

BS ISO 16700:2016 - TC


This standard BS ISO 16700:2016 - TC Tracked Changes. Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification is classified in these ICS categories:
  • 37.020 Optical equipment

Print