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Homepage>BS ISO 17867:2020 Particle size analysis. Small angle X-ray scattering (SAXS)
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sklademVydáno: 2020-10-09
BS ISO 17867:2020 Particle size analysis. Small angle X-ray scattering (SAXS)

BS ISO 17867:2020

Particle size analysis. Small angle X-ray scattering (SAXS)

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Označení normy:BS ISO 17867:2020
Počet stran:36
Vydáno:2020-10-09
ISBN:978 0 539 00600 1
Status:Standard
DESCRIPTION

BS ISO 17867:2020


This standard BS ISO 17867:2020 Particle size analysis. Small angle X-ray scattering (SAXS) is classified in these ICS categories:
  • 19.120 Particle size analysis. Sieving

This document specifies a method for the application of small-angle X-ray scattering (SAXS) to the estimation of mean particle sizes in the 1 nm to 100 nm size range. It is applicable in dilute dispersions where the interaction and scattering effects between the particles are negligible. This document describes several data evaluation methods: the Guinier approximation, model-based data fitting, Monte-Carlo–based data fitting, the indirect Fourier transform method and the expectation maximization method. The most appropriate evaluation method is intended to be selected by the analyst and stated clearly in the report. While the Guinier approximation only provides an estimate for the mean particle diameter, the other methods also give insight in the particle size distribution.