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Homepage>BS ISO 5618-2:2024 Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for GaN crystal surface defects Method for determining etch pit density
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sklademVydáno: 2024-05-07
BS ISO 5618-2:2024 Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for GaN crystal surface defects Method for determining etch pit density

BS ISO 5618-2:2024

Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for GaN crystal surface defects Method for determining etch pit density

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Označení normy:BS ISO 5618-2:2024
Počet stran:34
Vydáno:2024-05-07
ISBN:978 0 539 22479 5
Status:Standard
DESCRIPTION

BS ISO 5618-2:2024


This standard BS ISO 5618-2:2024 Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for GaN crystal surface defects is classified in these ICS categories:
  • 81.060.30 Advanced ceramics

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