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sklademVydáno: 2024-05-07
BS ISO 5618-2:2024
Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for GaN crystal surface defects Method for determining etch pit density
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| Označení normy: | BS ISO 5618-2:2024 |
| Počet stran: | 34 |
| Vydáno: | 2024-05-07 |
| ISBN: | 978 0 539 22479 5 |
| Status: | Standard |
DESCRIPTION
BS ISO 5618-2:2024
This standard BS ISO 5618-2:2024 Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for GaN crystal surface defects is classified in these ICS categories:
- 81.060.30 Advanced ceramics