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31.080.01 Polovodičové součástky obecně

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18/30383935 DC
BS EN IEC 62047-37. Semiconductor devices. Micro-electromechanical devices Part 37. Environmental test methods of MEMS piezoelectric thin films for sensor application

Vydáno: 2018-12-04

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BS IEC 62830-5:2021
Semiconductor devices. Semiconductor devices for energy harvesting and generation Test method for measuring generated power from flexible thermoelectric devices

Vydáno: 2021-02-03

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BS EN 60191-6-19:2010
Mechanical standardization of semiconductor devices Measurement methods of the package warpage at elevated temperature and the maximum permissible warpage

Vydáno: 2010-06-30

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BS EN 60191-6-6:2001
Mechanical standardization of semiconductor devices. General rules for the preparation of outline drawings of surface mounted semiconductor device packages Design guide for fine pitch land grid array (FLGA)

Vydáno: 2001-09-05

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BS EN 62007-2:2009
Semiconductor optoelectronic devices for fibre optic system applications Measuring methods

Vydáno: 2009-10-31

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BS EN 60749-2:2002
Semiconductor devices. Mechanical and climatic test methods Low air pressure

Vydáno: 2002-09-24

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PD ES 59008-5-2:2001
Data requirements for semiconductor die. Particular requirements and recommendations for die types Bare die with added connection structures

Vydáno: 2001-06-15

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BS EN 62415:2010
Semiconductor devices. Constant current electromigration test

Vydáno: 2010-07-31

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BS EN 60191-6-4:2003
Mechanical standardization of semiconductor devices. General rules for the preparation of outline drawings of surface mounted semiconductor device packages Measuring methods for package dimensions of ball grid array (BGA)

Vydáno: 2003-08-04

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BS EN IEC 60749-26:2018
Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)

Vydáno: 2018-04-30

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BS EN 62374-1:2010
Semiconductor devices Time-dependent dielectric breakdown (TDDB) test for inter-metal layers

Vydáno: 2011-06-30

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23/30472390 DC
BS EN 60747-16-11 Semiconductor devices Part 16-11. Microwave integrated circuits - Power detectors

Vydáno: 2023-04-04

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159 results

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