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BS EN 60749-4:2017
Semiconductor devices. Mechanical and climatic test methods Damp heat, steady state, highly accelerated stress test (HAST)
Semiconductor devices. Mechanical and climatic test methods Damp heat, steady state, highly accelerated stress test (HAST)
Vydáno: 2017-11-28
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183.40 €
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18.34 €
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55.02 €
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183.40 €
BS EN 60749-38:2008
Semiconductor devices. Mechanical and climatic test methods Soft error test method for semiconductor devices with memory
Semiconductor devices. Mechanical and climatic test methods Soft error test method for semiconductor devices with memory
Vydáno: 2008-06-30
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183.40 €
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18.34 €
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55.02 €
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183.40 €
BS IEC 60747-10:1991
Semiconductor devices Generic specification for discrete devices and integrated circuits
Semiconductor devices Generic specification for discrete devices and integrated circuits
Vydáno: 2011-07-31
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298.32 €
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29.83 €
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89.50 €
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298.32 €
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298.32 €
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29.83 €
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89.50 €
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298.32 €
BS 7241:1989
Specification for IEC 822 VSB: parallel sub-system bus of the IEC 821 VME bus
Specification for IEC 822 VSB: parallel sub-system bus of the IEC 821 VME bus
Vydáno: 1990-03-30
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383.91 €
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38.39 €
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115.17 €
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383.91 €
BS EN 60749-6:2017
Semiconductor devices. Mechanical and climatic test methods Storage at high temperature
Semiconductor devices. Mechanical and climatic test methods Storage at high temperature
Vydáno: 2017-11-24
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154.05 €
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15.41 €
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46.22 €
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154.05 €
BS EN 60749-40:2011
Semiconductor devices. Mechanical and climatic test methods Board level drop test method using a strain gauge
Semiconductor devices. Mechanical and climatic test methods Board level drop test method using a strain gauge
Vydáno: 2011-09-30
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254.31 €
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25.43 €
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76.29 €
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254.31 €
BS IEC 60747-14-5:2010
Semiconductor devices Semiconductor sensors. PN-junction semiconductor temperature sensor
Semiconductor devices Semiconductor sensors. PN-junction semiconductor temperature sensor
Vydáno: 2010-04-30
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18.34 €
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55.02 €
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183.40 €
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183.40 €
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18.34 €
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55.02 €
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BS EN 60749-23:2004+A1:2011
Semiconductor devices. Mechanical and climatic test methods High temperature operating life
Semiconductor devices. Mechanical and climatic test methods High temperature operating life
Vydáno: 2011-06-30
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15.41 €
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46.22 €
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154.05 €
Anglicky Secure PDF
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298.32 €
You can read the standard for 1 hour. More information in the category: E-reading
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29.83 €
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
89.50 €
Anglicky Hardcopy
In stock
298.32 €
Anglicky Secure PDF
Immediate download
254.31 €
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
25.43 €
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
76.29 €
Anglicky Hardcopy
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254.31 €