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31.080.01 Polovodičové součástky obecně

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BS EN 62418:2010
Semiconductor devices. Metallization stress void test

Vydáno: 2010-08-31

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BS IEC 62483:2013
Environmental acceptance requirements for tin whisker susceptibility of tin and tin alloy surface finishes on semiconductor devices

Vydáno: 2013-10-31

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BS EN IEC 60749-37:2022 - TC
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Board level drop test method using an accelerometer

Vydáno: 2022-12-20

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BS IEC 62047-37:2020
Semiconductor devices. Micro-electromechanical devices Environmental test methods of MEMS piezoelectric thin films for sensor application

Vydáno: 2023-04-05

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BS IEC 60747-5-15:2022
Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of the flat-band voltage based on the electroreflectance spectroscopy

Vydáno: 2022-07-19

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BS EN IEC 60747-16-6:2019
Semiconductor devices Microwave integrated circuits. Frequency multipliers

Vydáno: 2019-09-02

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BS EN 60068-2-77:1999
Environmental testing. Test methods Body strength and impact shock

Vydáno: 1999-09-15

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BS IEC 62615:2010
Electrostatic discharge sensitivity testing. Transmission line pulse (TLP). Component level

Vydáno: 2011-07-31

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13/30290462 DC
BS EN 60191-1. Mechanical standardization of semiconductor devices. Part 1. General rules for the preparation of outline drawings of discrete devices

Vydáno: 2013-09-10

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BS EN 60749-16:2003
Semiconductor devices. Mechanical and climatic test methods Particle impact noise detection (PIND)

Vydáno: 2004-06-24

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22/30451588 DC
BS EN 63150-3 Ed.1.0. Semiconductor devices. Measurement and evaluation methods of kinetic energy harvesting devices under practical vibration environment Part 3. Human foot impact motion

Vydáno: 2022-03-29

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23/30478757 DC
BS EN IEC 63287-3. Semiconductor devices. Generic semiconductor qualification guidelines Part 3. Guidelines for reliability qualification plans for power semiconductor module

Vydáno: 2023-08-17

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162 results

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