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31.080.01 Polovodičové součástky obecně

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BS IEC 62830-5:2021
Semiconductor devices. Semiconductor devices for energy harvesting and generation Test method for measuring generated power from flexible thermoelectric devices

Vydáno: 2021-02-03

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BS EN 60191-6-19:2010
Mechanical standardization of semiconductor devices Measurement methods of the package warpage at elevated temperature and the maximum permissible warpage

Vydáno: 2010-06-30

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BS EN 60191-6-6:2001
Mechanical standardization of semiconductor devices. General rules for the preparation of outline drawings of surface mounted semiconductor device packages Design guide for fine pitch land grid array (FLGA)

Vydáno: 2001-09-05

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BS EN IEC 62435-9:2021
Electronic components. Long-term storage of electronic semiconductor devices Special cases

Vydáno: 2021-10-11

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BS EN 62007-2:2009
Semiconductor optoelectronic devices for fibre optic system applications Measuring methods

Vydáno: 2009-10-31

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PD ES 59008-5-2:2001
Data requirements for semiconductor die. Particular requirements and recommendations for die types Bare die with added connection structures

Vydáno: 2001-06-15

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BS EN 60191-6-4:2003
Mechanical standardization of semiconductor devices. General rules for the preparation of outline drawings of surface mounted semiconductor device packages Measuring methods for package dimensions of ball grid array (BGA)

Vydáno: 2003-08-04

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BS EN 62374-1:2010
Semiconductor devices Time-dependent dielectric breakdown (TDDB) test for inter-metal layers

Vydáno: 2011-06-30

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BS EN IEC 60749-26:2018
Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)

Vydáno: 2018-04-30

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BS EN 61582:2006
Radiation protection instrumentation. In vivo counters. Classification, general requirements and test procedures for portable, transportable and installed equipment

Vydáno: 2006-06-30

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BS EN 60749-44:2016
Semiconductor devices. Mechanical and climatic test methods Neutron beam irradiated single event effect (SEE) test method for semiconductor devices

Vydáno: 2016-11-30

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BS EN IEC 60749-15:2020
Semiconductor devices. Mechanical and climatic test methods Resistance to soldering temperature for through-hole mounted devices

Vydáno: 2020-10-01

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157 results

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