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BS EN 60749-33:2004
Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased autoclave
Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased autoclave
Vydáno: 2004-06-22
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165.27 €
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16.53 €
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Reading the standardfor 24 hours
49.58 €
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165.27 €
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194.87 €
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19.49 €
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Reading the standardfor 24 hours
58.46 €
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In stock
194.87 €
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271.33 €
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27.13 €
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81.40 €
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271.33 €
BS EN 60749-3:2017
Semiconductor devices. Mechanical and climatic test methods External visual examination
Semiconductor devices. Mechanical and climatic test methods External visual examination
Vydáno: 2017-11-24
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194.87 €
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19.49 €
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58.46 €
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194.87 €
BS IEC 60747-14-4:2011
Semiconductor devices. Discrete devices Semiconductor accelerometers
Semiconductor devices. Discrete devices Semiconductor accelerometers
Vydáno: 2011-02-28
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407.00 €
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40.70 €
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Reading the standardfor 24 hours
122.10 €
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407.00 €
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194.87 €
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19.49 €
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58.46 €
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194.87 €
BS EN IEC 60749-41:2020
Semiconductor devices. Mechanical and climatic test methods Standard reliability testing methods of non-volatile memory devices
Semiconductor devices. Mechanical and climatic test methods Standard reliability testing methods of non-volatile memory devices
Vydáno: 2020-09-09
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271.33 €
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27.13 €
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81.40 €
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271.33 €
BS IEC 60747-1:2006+A1:2010
Semiconductor devices General
Semiconductor devices General
Vydáno: 2010-07-31
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357.67 €
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35.77 €
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107.30 €
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357.67 €
BS IEC 60747-9:2019
Semiconductor devices Discrete devices. Insulated-gate bipolar transistors (IGBTs)
Semiconductor devices Discrete devices. Insulated-gate bipolar transistors (IGBTs)
Vydáno: 2019-11-22
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407.00 €
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40.70 €
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122.10 €
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407.00 €
BS EN 60749-29:2011
Semiconductor devices. Mechanical and climatic test methods Latch-up test
Semiconductor devices. Mechanical and climatic test methods Latch-up test
Vydáno: 2011-08-31
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27.13 €
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81.40 €
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BS EN IEC 60749-17:2019
Semiconductor devices. Mechanical and climatic test methods Neutron irradiation
Semiconductor devices. Mechanical and climatic test methods Neutron irradiation
Vydáno: 2019-05-15
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165.27 €
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16.53 €
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49.58 €
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165.27 €
BS IEC 63284:2022
Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors
Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors
Vydáno: 2022-11-11
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194.87 €
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19.49 €
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58.46 €
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194.87 €