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31.080.01 Polovodičové součástky obecně

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BS EN 62415:2010
Semiconductor devices. Constant current electromigration test

Vydáno: 2010-07-31

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BS EN IEC 62435-9:2021
Electronic components. Long-term storage of electronic semiconductor devices Special cases

Vydáno: 2021-10-11

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BS EN IEC 60749-39:2022 - TC
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components

Vydáno: 2022-03-17

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18/30383935 DC
BS EN IEC 62047-37. Semiconductor devices. Micro-electromechanical devices Part 37. Environmental test methods of MEMS piezoelectric thin films for sensor application

Vydáno: 2018-12-04

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BS IEC 60747-14-10:2019
Semiconductor devices Semiconductor sensors. Performance evaluation methods for wearable glucose sensors

Vydáno: 2019-11-22

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BS EN 60191-6-19:2010
Mechanical standardization of semiconductor devices Measurement methods of the package warpage at elevated temperature and the maximum permissible warpage

Vydáno: 2010-06-30

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BS EN 60191-6-6:2001
Mechanical standardization of semiconductor devices. General rules for the preparation of outline drawings of surface mounted semiconductor device packages Design guide for fine pitch land grid array (FLGA)

Vydáno: 2001-09-05

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BS IEC 62830-5:2021
Semiconductor devices. Semiconductor devices for energy harvesting and generation Test method for measuring generated power from flexible thermoelectric devices

Vydáno: 2021-02-03

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BS EN 62374-1:2010
Semiconductor devices Time-dependent dielectric breakdown (TDDB) test for inter-metal layers

Vydáno: 2011-06-30

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BS EN IEC 60749-26:2018
Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)

Vydáno: 2018-04-30

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BS EN 60191-6-4:2003
Mechanical standardization of semiconductor devices. General rules for the preparation of outline drawings of surface mounted semiconductor device packages Measuring methods for package dimensions of ball grid array (BGA)

Vydáno: 2003-08-04

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BS EN IEC 60749-28:2022 - TC
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). device level

Vydáno: 2022-12-22

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162 results

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