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BS EN IEC 60749-17:2019 - TC
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Neutron irradiation
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Neutron irradiation
Vydáno: 2020-02-24
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195.84 €
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19.58 €
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58.75 €
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195.84 €
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19.58 €
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58.75 €
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22/30443678 DC
BS EN 60749-34-1. Semiconductor devices. Mechanical and climatic test methods Part 34-1. Power cycling test for power semiconductor module
BS EN 60749-34-1. Semiconductor devices. Mechanical and climatic test methods Part 34-1. Power cycling test for power semiconductor module
Vydáno: 2022-03-30
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379.29 €
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37.93 €
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113.79 €
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BS EN IEC 63287-2:2023
Semiconductor devices. Guidelines for reliability qualification plans Concept of mission profile
Semiconductor devices. Guidelines for reliability qualification plans Concept of mission profile
Vydáno: 2023-05-23
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BS IEC 60747-5-4:2022+A1:2024
Semiconductor devices Optoelectronic devices. Semiconductor lasers
Semiconductor devices Optoelectronic devices. Semiconductor lasers
Vydáno: 2025-01-13
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31.98 €
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95.94 €
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BS EN IEC 60749-10:2022 - TC
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Mechanical shock. device and subassembly
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Mechanical shock. device and subassembly
Vydáno: 2022-09-15
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BS EN IEC 60749-37:2022
Semiconductor devices. Mechanical and climatic test methods Board level drop test method using an accelerometer
Semiconductor devices. Mechanical and climatic test methods Board level drop test method using an accelerometer
Vydáno: 2022-11-22
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81.81 €
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BS EN IEC 60749-5:2024
Semiconductor devices. Mechanical and climatic test methods Steady-state temperature humidity bias life test
Semiconductor devices. Mechanical and climatic test methods Steady-state temperature humidity bias life test
Vydáno: 2024-02-06
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