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BS EN 60749-29:2011
Semiconductor devices. Mechanical and climatic test methods Latch-up test
Semiconductor devices. Mechanical and climatic test methods Latch-up test
Vydáno: 2011-08-31
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272.69 €
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27.27 €
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Reading the standardfor 24 hours
81.81 €
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272.69 €
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195.84 €
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19.58 €
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Reading the standardfor 24 hours
58.75 €
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195.84 €
BS IEC 60747-1:2006+A1:2010
Semiconductor devices General
Semiconductor devices General
Vydáno: 2010-07-31
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359.46 €
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35.95 €
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107.84 €
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359.46 €
BS IEC 60747-9:2019
Semiconductor devices Discrete devices. Insulated-gate bipolar transistors (IGBTs)
Semiconductor devices Discrete devices. Insulated-gate bipolar transistors (IGBTs)
Vydáno: 2019-11-22
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409.04 €
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40.90 €
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Reading the standardfor 24 hours
122.71 €
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409.04 €
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Immediate download
195.84 €
You can read the standard for 1 hour. More information in the category: E-reading
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19.58 €
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Reading the standardfor 24 hours
58.75 €
Anglicky Hardcopy
In stock
195.84 €
Anglicky Secure PDF
Immediate download
272.69 €
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
27.27 €
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
81.81 €
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272.69 €
BS EN 60749-3:2017
Semiconductor devices. Mechanical and climatic test methods External visual examination
Semiconductor devices. Mechanical and climatic test methods External visual examination
Vydáno: 2017-11-24
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195.84 €
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19.58 €
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58.75 €
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195.84 €
BS IEC 60747-14-4:2011
Semiconductor devices. Discrete devices Semiconductor accelerometers
Semiconductor devices. Discrete devices Semiconductor accelerometers
Vydáno: 2011-02-28
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409.04 €
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40.90 €
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122.71 €
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409.04 €
BS EN 60749-34:2010
Semiconductor devices. Mechanical and climatic test methods Power cycling
Semiconductor devices. Mechanical and climatic test methods Power cycling
Vydáno: 2011-02-28
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166.09 €
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16.61 €
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49.83 €
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166.09 €
BS EN IEC 60749-41:2020
Semiconductor devices. Mechanical and climatic test methods Standard reliability testing methods of non-volatile memory devices
Semiconductor devices. Mechanical and climatic test methods Standard reliability testing methods of non-volatile memory devices
Vydáno: 2020-09-09
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272.69 €
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27.27 €
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81.81 €
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272.69 €
BS EN 60749-27:2006+A1:2012
Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Machine model (MM)
Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Machine model (MM)
Vydáno: 2013-01-31
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195.84 €
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19.58 €
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58.75 €
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195.84 €
BS EN 60749-14:2003
Semiconductor devices. Mechanical and climatic test methods Robustness of terminations (lead integrity)
Semiconductor devices. Mechanical and climatic test methods Robustness of terminations (lead integrity)
Vydáno: 2003-12-15
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195.84 €
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19.58 €
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58.75 €
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195.84 €