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BS 7241:1989
Specification for IEC 822 VSB: parallel sub-system bus of the IEC 821 VME bus

Vydáno: 1990-03-30

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BS EN 60749-4:2017
Semiconductor devices. Mechanical and climatic test methods Damp heat, steady state, highly accelerated stress test (HAST)

Vydáno: 2017-11-28

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BS EN 60749-6:2017
Semiconductor devices. Mechanical and climatic test methods Storage at high temperature

Vydáno: 2017-11-24

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BS EN 60749-40:2011
Semiconductor devices. Mechanical and climatic test methods Board level drop test method using a strain gauge

Vydáno: 2011-09-30

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BS EN 60749-23:2004+A1:2011
Semiconductor devices. Mechanical and climatic test methods High temperature operating life

Vydáno: 2011-06-30

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PD ES 59008-6-2:2001
Data requirements for semiconductor die. Exchange data formats and data dictionary Data dictionary

Vydáno: 2001-06-15

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BS IEC 62951-5:2019
Semiconductor devices. Flexible and stretchable semiconductor devices Test method for thermal characteristics of flexible materials

Vydáno: 2019-03-05

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BS EN 60191-6-8:2001
Mechanical standardization of semiconductor devices. General rules for the preparation of outline drawings of surface mounted semiconductor device packages Design guide for glass sealed ceramic quad flatpack (G-QFP)

Vydáno: 2001-11-16

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BS IEC 62047-29:2017
Semiconductor devices. Micro-electromechanical devices Electromechanical relaxation test method for freestanding conductive thin-films under room temperature

Vydáno: 2018-03-15

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BS EN 60191-6-16:2007
Mechanical standardization of semiconductor devices Glossary of semiconductor tests and burn-in sockets for BGA, LGA, FBGA and FLGA

Vydáno: 2007-07-31

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BS IEC 63229:2021
Semiconductor devices. Classification of defects in gallium nitride epitaxial film on silicon carbide substrate

Vydáno: 2023-08-31

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23/30469010 DC
BS EN IEC 63378-3. Thermal standardization on semiconductor packages Part 3. Thermal circuit simulation models of discrete semiconductor packages for transient analysis

Vydáno: 2023-02-03

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