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BS EN 60191-6-13:2016
Mechanical standardization of semiconductor devices Design guideline of open-top-type sockets for Fine-pitch Ball Grid Array (FBGA) and Fine-pitch Land Grid Array (FLGA)

Vydáno: 2016-12-31

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BS EN 60749-7:2011
Semiconductor devices. Mechanical and climatic test methods Internal moisture content measurement and the analysis of other residual gases

Vydáno: 2011-09-30

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BS QC 750100:1986+A2:1996
Harmonized system of quality assessment for electronic components. Discrete semiconductor devices. Sectional specification

Vydáno: 2010-01-31

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BS EN 62374:2007
Semiconductor devices. Time dependent dielectric breakdown (TDDB) test for gate dielectric films

Vydáno: 2008-10-31

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BS IEC 796-1:1990
Microprocessor system bus. 8-bit and 16-bit data MULTIBUS I Functional description with electrical and timing specifications

Vydáno: 1991-02-28

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BS EN IEC 60068-2-13:2021
Environmental testing Tests. Test M: Low air pressure

Vydáno: 2021-04-26

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BS EN IEC 60749-17:2019 - TC
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Neutron irradiation

Vydáno: 2020-02-24

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BS IEC 60747-5-9:2019
Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of the internal quantum efficiency based on the temperature-dependent electroluminescence

Vydáno: 2020-01-14

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BS EN 60749-8:2003
Semiconductor devices. Mechanical and climatic test methods Sealing

Vydáno: 2003-07-03

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BS EN 60191-6-18:2010
Mechanical standardization of semiconductor devices General rules for the preparation of outline drawings of surface mounted semiconductor device packages. Design guide for ball grid array (BGA)

Vydáno: 2010-10-31

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BS EN 60191-6-5:2001
Mechanical standardization of semiconductor devices. General rules for the preparation of outline drawings of surface mounted semiconductor device packages Design guide for fine-pitchball grid array (FBGA)

Vydáno: 2001-11-15

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BS IEC 63068-3:2020
Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices Test method for defects using photoluminescence

Vydáno: 2020-07-24

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156 results

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