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BS EN IEC 60749-37:2022 - TC
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Board level drop test method using an accelerometer
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Board level drop test method using an accelerometer
Vydáno: 2022-12-20
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BS EN IEC 60749-37:2022
Semiconductor devices. Mechanical and climatic test methods Board level drop test method using an accelerometer
Semiconductor devices. Mechanical and climatic test methods Board level drop test method using an accelerometer
Vydáno: 2022-11-22
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74.18 €
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BS EN IEC 60749-41:2020
Semiconductor devices. Mechanical and climatic test methods Standard reliability testing methods of non-volatile memory devices
Semiconductor devices. Mechanical and climatic test methods Standard reliability testing methods of non-volatile memory devices
Vydáno: 2020-09-09
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74.18 €
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BS EN IEC 60749-5:2024 - TC
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Steady-state temperature humidity bias life test
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Steady-state temperature humidity bias life test
Vydáno: 2024-02-09
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BS EN IEC 60749-5:2024
Semiconductor devices. Mechanical and climatic test methods Steady-state temperature humidity bias life test
Semiconductor devices. Mechanical and climatic test methods Steady-state temperature humidity bias life test
Vydáno: 2024-02-06
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87.02 €
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BS EN IEC 62435-9:2021
Electronic components. Long-term storage of electronic semiconductor devices Special cases
Electronic components. Long-term storage of electronic semiconductor devices Special cases
Vydáno: 2021-10-11
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BS EN IEC 63244-1:2021
Semiconductor devices. Semiconductor devices for wireless power transfer and charging General requirements and specifications
Semiconductor devices. Semiconductor devices for wireless power transfer and charging General requirements and specifications
Vydáno: 2021-11-05
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