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BS EN 62417:2010
Semiconductor devices. Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)
Semiconductor devices. Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)
Vydáno: 2010-06-30
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154.20 €
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15.42 €
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46.26 €
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154.20 €
BS EN 62373:2006
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
Vydáno: 2006-09-29
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183.58 €
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18.36 €
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55.07 €
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183.58 €
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183.58 €
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18.36 €
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55.07 €
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183.58 €
BS IEC 60747-4:2007+A1:2017
Semiconductor devices. Discrete devices Microwave diodes and transistors
Semiconductor devices. Discrete devices Microwave diodes and transistors
Vydáno: 2020-05-26
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384.29 €
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38.43 €
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115.29 €
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384.29 €
BS IEC 60747-9:2019
Semiconductor devices Discrete devices. Insulated-gate bipolar transistors (IGBTs)
Semiconductor devices Discrete devices. Insulated-gate bipolar transistors (IGBTs)
Vydáno: 2019-11-22
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384.29 €
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38.43 €
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115.29 €
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384.29 €
BS IEC 60747-8:2010+A1:2021
Semiconductor devices. Discrete devices Field-effect transistors
Semiconductor devices. Discrete devices Field-effect transistors
Vydáno: 2021-07-09
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38.43 €
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115.29 €
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384.29 €
BS IEC 63284:2022
Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors
Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors
Vydáno: 2022-11-11
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18.36 €
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55.07 €
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183.58 €
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254.56 €
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25.46 €
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76.37 €
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254.56 €
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183.58 €
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18.36 €
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55.07 €
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183.58 €
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254.56 €
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25.46 €
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76.37 €
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254.56 €
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24.48 €
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24.48 €
BS IEC 60747-8-4:2004
Discrete semiconductor devices Metal-oxide semiconductor field-effect transistors (MOSFETs) for power switching applications
Discrete semiconductor devices Metal-oxide semiconductor field-effect transistors (MOSFETs) for power switching applications
Vydáno: 2004-11-09
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354.92 €
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35.49 €
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Reading the standardfor 24 hours
106.48 €
Anglicky Hardcopy
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354.92 €