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BS EN 62373:2006
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
Vydáno: 2006-09-29
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BS EN 62417:2010
Semiconductor devices. Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)
Semiconductor devices. Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)
Vydáno: 2010-06-30
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BS IEC 60747-4:2007+A1:2017
Semiconductor devices. Discrete devices Microwave diodes and transistors
Semiconductor devices. Discrete devices Microwave diodes and transistors
Vydáno: 2020-05-26
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BS IEC 60747-7:2010+A1:2019
Semiconductor devices. Discrete devices Bipolar transistors
Semiconductor devices. Discrete devices Bipolar transistors
Vydáno: 2019-10-23
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BS IEC 60747-8-4:2004
Discrete semiconductor devices Metal-oxide semiconductor field-effect transistors (MOSFETs) for power switching applications
Discrete semiconductor devices Metal-oxide semiconductor field-effect transistors (MOSFETs) for power switching applications
Vydáno: 2004-11-09
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BS IEC 62899-503-3:2021
Printed electronics Quality assessment. Measuring method of contact resistance for the printed thin film transistor. Transfer length method
Printed electronics Quality assessment. Measuring method of contact resistance for the printed thin film transistor. Transfer length method
Vydáno: 2021-09-08
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