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BS EN 62373:2006
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
Vydáno: 2006-09-29
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19.62 €
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58.86 €
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196.19 €
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196.19 €
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19.62 €
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58.86 €
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196.19 €
BS EN 62417:2010
Semiconductor devices. Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)
Semiconductor devices. Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)
Vydáno: 2010-06-30
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166.39 €
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16.64 €
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49.92 €
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166.39 €
BS IEC 60747-4:2007+A1:2017
Semiconductor devices. Discrete devices Microwave diodes and transistors
Semiconductor devices. Discrete devices Microwave diodes and transistors
Vydáno: 2020-05-26
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409.77 €
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40.98 €
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122.93 €
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409.77 €
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166.39 €
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16.64 €
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49.92 €
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166.39 €
Anglicky Secure PDF
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24.83 €
Anglicky Hardcopy
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24.83 €
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196.19 €
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19.62 €
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58.86 €
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BS IEC 62899-503-1:2020
Printed electronics Quality assessment. Test method of displacement current measurement for printed thin-film transistor
Printed electronics Quality assessment. Test method of displacement current measurement for printed thin-film transistor
Vydáno: 2020-09-25
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BS IEC 62899-503-3:2021
Printed electronics Quality assessment. Measuring method of contact resistance for the printed thin film transistor. Transfer length method
Printed electronics Quality assessment. Measuring method of contact resistance for the printed thin film transistor. Transfer length method
Vydáno: 2021-09-08
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58.86 €
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BS IEC 60747-9:2019
Semiconductor devices Discrete devices. Insulated-gate bipolar transistors (IGBTs)
Semiconductor devices Discrete devices. Insulated-gate bipolar transistors (IGBTs)
Vydáno: 2019-11-22
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BS IEC 60747-8:2010+A1:2021
Semiconductor devices. Discrete devices Field-effect transistors
Semiconductor devices. Discrete devices Field-effect transistors
Vydáno: 2021-07-09
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122.93 €
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409.77 €