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BS IEC 62899-503-3:2021
Printed electronics Quality assessment. Measuring method of contact resistance for the printed thin film transistor. Transfer length method

Vydáno: 2021-09-08

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BS IEC 62899-503-1:2020
Printed electronics Quality assessment. Test method of displacement current measurement for printed thin-film transistor

Vydáno: 2020-09-25

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BS IEC 63275-1:2022
Semiconductor devices. Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors Test method for bias temperature instability

Vydáno: 2022-10-05

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BS IEC 60747-8:2010+A1:2021
Semiconductor devices. Discrete devices Field-effect transistors

Vydáno: 2021-07-09

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BS IEC 60747-9:2019
Semiconductor devices Discrete devices. Insulated-gate bipolar transistors (IGBTs)

Vydáno: 2019-11-22

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BS IEC 63284:2022
Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors

Vydáno: 2022-11-11

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BS IEC 62373-1:2020
Semiconductor devices. Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) Fast BTI test for MOSFET

Vydáno: 2023-03-30

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19 results

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