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BS EN 62047-7:2011
Semiconductor devices. Micro-electromechanical devices MEMS BAW filter and duplexer for radio frequency control and selection

Vydáno: 2011-08-31

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BS IEC 62951-6:2019
Semiconductor devices. Flexible and stretchable semiconductor devices Test method for sheet resistance of flexible conducting films

Vydáno: 2019-05-15

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BS IEC 60747-14-2:2000
Discrete semiconductor devices and integrated circuits. Semiconductor devices. Semiconductor sensors Hall elements

Vydáno: 2001-05-15

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BS EN 60747-16-1:2002+A2:2017
Semiconductor devices Microwave integrated circuits. Amplifiers

Vydáno: 2018-04-10

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BS EN 62258-5:2006
Semiconductor die products Requirements for information concerning electrical simulation

Vydáno: 2006-11-30

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BS EN 62374:2007
Semiconductor devices. Time dependent dielectric breakdown (TDDB) test for gate dielectric films

Vydáno: 2008-10-31

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BS CECC 50000:Supplement No. 1:1983
Harmonized system of quality assessment for electronic components. Generic specification: discrete semiconductor devices. CECC assessed process average

Vydáno: 1983-05-31

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BS EN 62047-21:2014
Semiconductor devices. Micro-electromechanical devices Test method for Poisson's ratio of thin film MEMS materials

Vydáno: 2014-10-31

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BS IEC 63068-3:2020
Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices Test method for defects using photoluminescence

Vydáno: 2020-07-24

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BS EN 60747-16-5:2013+A1:2020
Semiconductor devices Microwave integrated circuits. Oscillators

Vydáno: 2020-09-24

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BS IEC 60747-18-3:2019
Semiconductor devices Semiconductor bio sensors. Fluid flow characteristics of lens-free CMOS photonic array sensor package modules with fluidic system

Vydáno: 2020-01-14

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BS EN 61967-2:2005
Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz Measurement of radiated emissions. TEM cell and wideband TEM cell method

Vydáno: 2006-01-23

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