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BS EN 62047-12:2011
Semiconductor devices. Micro-electromechanical devices Bending fatigue testing method of thin film materials using resonant vibration of MEMS structures

Vydáno: 2011-11-30

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PD IEC/TR 62258-8:2008
Semiconductor die products EXPRESS model schema for data exchange

Vydáno: 2008-09-30

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BS IEC 62047-31:2019
Semiconductor devices. Micro-electromechanical devices Four-point bending test method for interfacial adhesion energy of layered MEMS materials

Vydáno: 2019-04-17

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BS EN 62258-2:2011
Semiconductor die products Exchange data formats

Vydáno: 2011-07-31

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BS IEC 62830-1:2017
Semiconductor devices. Semiconductor devices for energy harvesting and generation Vibration based piezoelectric energy harvesting

Vydáno: 2020-07-21

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BS EN 60747-16-3:2002+A2:2017
Semiconductor devices Microwave integrated circuits. Frequency converters

Vydáno: 2018-02-23

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BS IEC 60747-18-1:2019
Semiconductor devices Semiconductor bio sensors. Test method and data analysis for calibration of lens-free CMOS photonic array sensors

Vydáno: 2019-06-07

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BS EN 62047-2:2006
Semiconductor devices. Micro-electromechanical devices Tensile testing method of thin film materials

Vydáno: 2006-11-30

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BS IEC 62047-37:2020
Semiconductor devices. Micro-electromechanical devices Environmental test methods of MEMS piezoelectric thin films for sensor application

Vydáno: 2023-04-05

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BS IEC 60747-5-15:2022
Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of the flat-band voltage based on the electroreflectance spectroscopy

Vydáno: 2022-07-19

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BS EN IEC 60747-16-6:2019
Semiconductor devices Microwave integrated circuits. Frequency multipliers

Vydáno: 2019-09-02

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24/30486622 DC
BS EN IEC 62047-49. Semiconductor devices. Micro-electromechanical devices Part 49. Reliability test methods of electro-mechanical conversion characteristics of piezoelectric MEMS cantilever

Vydáno: 2024-02-01

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151 results

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