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BS EN 62047-8:2011
Semiconductor devices. Micro-electromechanical devices Strip bending test method for tensile property measurement of thin films
Semiconductor devices. Micro-electromechanical devices Strip bending test method for tensile property measurement of thin films
Vydáno: 2011-06-30
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22/30430766 DC
BS EN 60947-10. Low-voltage switchgear and controlgear Part 10. Semiconductor Circuit-Breakers
BS EN 60947-10. Low-voltage switchgear and controlgear Part 10. Semiconductor Circuit-Breakers
Vydáno: 2022-05-05
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BS IEC 62830-7:2021
Semiconductor devices. Semiconductor devices for energy harvesting and generation Linear sliding mode triboelectric energy harvesting
Semiconductor devices. Semiconductor devices for energy harvesting and generation Linear sliding mode triboelectric energy harvesting
Vydáno: 2023-07-07
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BS EN IEC 60747-16-8:2022
Semiconductor devices Microwave integrated circuits. Limiters
Semiconductor devices Microwave integrated circuits. Limiters
Vydáno: 2023-05-25
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24/30499668 DC
BS EN IEC 63550-1 Semiconductor devices - Neuromorphic devices Part 1: Evaluation method of basic characteristics in memristor devices
BS EN IEC 63550-1 Semiconductor devices - Neuromorphic devices Part 1: Evaluation method of basic characteristics in memristor devices
Vydáno: 2024-08-30
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24/30500231 DC
BS EN IEC 63550-3 Semiconductor devices. Neuromorphic devices Part 3. Evaluation method of spike dependent plasticity in memristor devices
BS EN IEC 63550-3 Semiconductor devices. Neuromorphic devices Part 3. Evaluation method of spike dependent plasticity in memristor devices
Vydáno: 2024-09-13
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24/30500235 DC
BS EN IEC 62047-53 Semiconductor devices. Micro-electromechanical devices Part 53. MEMS electrothermal transfer device
BS EN IEC 62047-53 Semiconductor devices. Micro-electromechanical devices Part 53. MEMS electrothermal transfer device
Vydáno: 2024-09-13
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24/30499009 DC
BS IEC 63581-1 Semiconductor devices - The recognition criteria of defects in polished indium phosphide wafers Part 1: Classification of defects
BS IEC 63581-1 Semiconductor devices - The recognition criteria of defects in polished indium phosphide wafers Part 1: Classification of defects
Vydáno: 2024-08-16
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