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BS IEC 62951-2:2019
Semiconductor devices. Flexible and stretchable semiconductor devices Evaluation method for electron mobility, sub-threshold swing, and threshold voltage of flexible devices

Vydáno: 2019-04-30

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BS IEC 63068-1:2019
Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices Classification of defects

Vydáno: 2019-05-10

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BS EN IEC 62031:2020+A11:2021
LED modules for general lighting. Safety specifications

Vydáno: 2022-03-31

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BS EN 62258-1:2010
Semiconductor die products Procurement and use

Vydáno: 2010-11-30

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BS EN 62047-25:2016
Semiconductor devices. Micro-electromechanical devices Silicon based MEMS fabrication technology. Measurement method of pull-press and shearing strength of micro bonding area

Vydáno: 2016-11-30

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BS IEC 62047-36:2019
Semiconductor devices. Micro-electromechanical devices Environmental and dielectric withstand test methods for MEMS piezoelectric thin films

Vydáno: 2019-04-24

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BS EN IEC 63373:2022
Dynamic on-resistance test method guidelines for GaN HEMT based power conversion devices

Vydáno: 2022-06-17

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BS EN IEC 60747-15:2024
Semiconductor devices Discrete devices. Isolated power semiconductor devices

Vydáno: 2024-12-03

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24/30499096 DC
BS EN IEC 63602 Guidelines for Representing Switching Losses of SIC MOSFETs in Datasheets (Fast track)

Vydáno: 2024-10-04

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24/30500166 DC
BS EN IEC 63550-4 Semiconductor devices. Neuromorphic devices Evaluation method of asymmetry in neuromorphic memristor devices

Vydáno: 2024-09-06

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24/30497861 DC
BS EN IEC 63551-1. Semiconductor devices. Detection modules of autonomous land vehicle Part 1. Testing methods of detection performance for LiDAR

Vydáno: 2024-08-01

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24/30497109 DC
BS EN IEC 63068-5 Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices Part 5. Test method for defects using X-ray topography

Vydáno: 2024-07-12

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151 results

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