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BS EN IEC 62047-52 Semiconductor devices. Micro-electromechanical devices Part 52. Biaxial tensile testing method for stretchable MEMS
BS EN IEC 62047-52 Semiconductor devices. Micro-electromechanical devices Part 52. Biaxial tensile testing method for stretchable MEMS
Vydáno: 2024-09-13
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BS EN IEC 62969-4:2018
Semiconductor devices. Semiconductor interface for automotive vehicles Evaluation method of data interface for automotive vehicle sensors
Semiconductor devices. Semiconductor interface for automotive vehicles Evaluation method of data interface for automotive vehicle sensors
Vydáno: 2018-08-30
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76.29 €
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BS EN 60747-5-3:2001
Discrete semiconductor devices and integrated circuits. Optoelectronic devices Measuring methods
Discrete semiconductor devices and integrated circuits. Optoelectronic devices Measuring methods
Vydáno: 2003-01-20
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BS IEC 60747-14-3:2009
Semiconductor devices Semiconductor sensors. Pressure sensors
Semiconductor devices Semiconductor sensors. Pressure sensors
Vydáno: 2009-07-31
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BS IEC 62047-28:2017
Semiconductor devices. Micro-electromechanical devices Performance testing method of vibration-driven MEMS electret energy harvesting devices
Semiconductor devices. Micro-electromechanical devices Performance testing method of vibration-driven MEMS electret energy harvesting devices
Vydáno: 2020-07-22
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BS EN 62047-26:2016
Semiconductor devices. Micro-electromechanical devices Description and measurement methods for micro trench and needle structures
Semiconductor devices. Micro-electromechanical devices Description and measurement methods for micro trench and needle structures
Vydáno: 2016-05-31
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BS EN 62258-6:2006
Semiconductor die products Requirements for information concerning thermal simulation
Semiconductor die products Requirements for information concerning thermal simulation
Vydáno: 2006-11-30
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