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BS EN 62047-2:2006
Semiconductor devices. Micro-electromechanical devices Tensile testing method of thin film materials
Semiconductor devices. Micro-electromechanical devices Tensile testing method of thin film materials
Vydáno: 2006-11-30
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178.32 €
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17.83 €
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Reading the standardfor 24 hours
53.50 €
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In stock
178.32 €
BS EN 62047-3:2006
Semiconductor devices. Micro-electromechanical devices Thin film standard test piece for tensile testing
Semiconductor devices. Micro-electromechanical devices Thin film standard test piece for tensile testing
Vydáno: 2006-11-30
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149.79 €
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Reading the standardfor 1 hour
14.98 €
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Reading the standardfor 24 hours
44.94 €
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In stock
149.79 €
BS EN 62047-4:2010
Semiconductor devices. Micro-electromechanical devices Generic specification for MEMS
Semiconductor devices. Micro-electromechanical devices Generic specification for MEMS
Vydáno: 2010-11-30
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247.28 €
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24.73 €
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74.18 €
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In stock
247.28 €
BS EN 62047-5:2011
Semiconductor devices. Micro-electromechanical devices RF MEMS switches
Semiconductor devices. Micro-electromechanical devices RF MEMS switches
Vydáno: 2013-04-30
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290.07 €
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29.01 €
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Reading the standardfor 24 hours
87.02 €
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In stock
290.07 €
BS EN 62047-6:2010
Semiconductor devices. Micro-electromechanical devices Axial fatigue testing methods of thin film materials
Semiconductor devices. Micro-electromechanical devices Axial fatigue testing methods of thin film materials
Vydáno: 2010-04-30
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178.32 €
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17.83 €
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53.50 €
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178.32 €
BS EN 62047-7:2011
Semiconductor devices. Micro-electromechanical devices MEMS BAW filter and duplexer for radio frequency control and selection
Semiconductor devices. Micro-electromechanical devices MEMS BAW filter and duplexer for radio frequency control and selection
Vydáno: 2011-08-31
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290.07 €
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Reading the standardfor 1 hour
29.01 €
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Reading the standardfor 24 hours
87.02 €
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290.07 €
BS EN 62047-8:2011
Semiconductor devices. Micro-electromechanical devices Strip bending test method for tensile property measurement of thin films
Semiconductor devices. Micro-electromechanical devices Strip bending test method for tensile property measurement of thin films
Vydáno: 2011-06-30
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178.32 €
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17.83 €
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53.50 €
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178.32 €
BS EN 62047-9:2011
Semiconductor devices. Micro-electromechanical devices Wafer to wafer bonding strength measurement for MEMS
Semiconductor devices. Micro-electromechanical devices Wafer to wafer bonding strength measurement for MEMS
Vydáno: 2013-01-31
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247.28 €
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24.73 €
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74.18 €
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247.28 €
BS EN 62258-1:2010
Semiconductor die products Procurement and use
Semiconductor die products Procurement and use
Vydáno: 2010-11-30
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328.12 €
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32.81 €
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98.44 €
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328.12 €
BS EN 62258-2:2011
Semiconductor die products Exchange data formats
Semiconductor die products Exchange data formats
Vydáno: 2011-07-31
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373.29 €
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37.33 €
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Reading the standardfor 24 hours
111.99 €
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373.29 €
BS EN 62258-5:2006
Semiconductor die products Requirements for information concerning electrical simulation
Semiconductor die products Requirements for information concerning electrical simulation
Vydáno: 2006-11-30
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178.32 €
You can read the standard for 1 hour. More information in the category: E-reading
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17.83 €
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Reading the standardfor 24 hours
53.50 €
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In stock
178.32 €
BS EN 62258-6:2006
Semiconductor die products Requirements for information concerning thermal simulation
Semiconductor die products Requirements for information concerning thermal simulation
Vydáno: 2006-11-30
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149.79 €
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
14.98 €
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Reading the standardfor 24 hours
44.94 €
Anglicky Hardcopy
In stock
149.79 €