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BS IEC 62047-35:2019
Semiconductor devices. Micro-electromechanical devices Test method of electrical characteristics under bending deformation for flexible electromechanical devices

Vydáno: 2021-04-20

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BS IEC 60747-5-8:2019
Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of optoelectronic efficiencies of light emitting diodes

Vydáno: 2019-11-27

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BS EN 62047-19:2013
Semiconductor devices. Micro-electromechanical devices Electronic compasses

Vydáno: 2013-10-31

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BS EN 62047-15:2015
Semiconductor devices. Micro-electromechanical devices Test method of bonding strength between PDMS and glass

Vydáno: 2015-07-31

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21/30440970 DC
BS EN IEC 60747-5-16. Semiconductor devices Part 5-16. Optoelectronic devices. Light emitting diodes. Test method of the flat-band voltage based on the photocurrent spectroscopy

Vydáno: 2021-12-07

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23/30454366 DC
BS EN IEC 62047-45. Semiconductor devices. Micro-electromechanical devices Part 45. Silicon based MEMS fabrication technology. Measurement method of impact resistance of nanostructures

Vydáno: 2023-04-20

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BS IEC 60747-5-16:2023
Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of the flat-band voltage of GaN-based light emitting diodes based on the photocurrent spectroscopy

Vydáno: 2023-04-05

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BS EN IEC 63364-1:2022
Semiconductor devices. Semiconductor devices for IoT system Test method of sound variation detection

Vydáno: 2023-02-02

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BS EN IEC 60747-16-7:2022
Semiconductor devices Microwave integrated circuits. Attenuators

Vydáno: 2023-05-25

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BS EN IEC 60747-15:2024 - TC
Tracked Changes. Semiconductor devices Discrete devices. Isolated power semiconductor devices

Vydáno: 2024-12-20

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BS IEC 63284:2022
Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors

Vydáno: 2022-11-11

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23/30479765 DC
BS IEC 63512. Test method for continuous-switching evaluation of gallium nitride power conversion devices

Vydáno: 2023-09-25

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