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23/30481371 DC
BS EN IEC 62047-4 Semiconductor devices. Micro-electromechanical devices Part 4. Generic specification for MEMS

Vydáno: 2023-10-20

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23/30476409 DC
BS IEC 60947-10. Low-voltage switchgear and controlgear Part 10. Semiconductor Circuit-Breakers

Vydáno: 2023-07-05

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24/30488515 DC
BS EN IEC 62047-50. Semiconductor devices. Micro-electromechanical devices Part 50. MEMS capacitive microphone

Vydáno: 2024-03-05

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24/30497113 DC
BS EN IEC 63567-1 Semiconductor devices. Performance evaluation of semiconductor processing components and inspection equipment Part 1. Transmittance evaluation method of EUV pellicle

Vydáno: 2024-07-12

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BS IEC 62047-47:2024
Semiconductor devices. Micro-electromechanical devices Silicon based MEMS fabrication technology. Measurement method of bending strength of microstructures

Vydáno: 2024-08-28

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BS EN 62830-3:2017
Semiconductor devices. Semiconductor devices for energy harvesting and generation Vibration based electromagnetic energy harvesting

Vydáno: 2017-04-30

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BS IEC 62951-2:2019
Semiconductor devices. Flexible and stretchable semiconductor devices Evaluation method for electron mobility, sub-threshold swing, and threshold voltage of flexible devices

Vydáno: 2019-04-30

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BS IEC 63068-1:2019
Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices Classification of defects

Vydáno: 2019-05-10

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BS IEC 62047-29:2017
Semiconductor devices. Micro-electromechanical devices Electromechanical relaxation test method for freestanding conductive thin-films under room temperature

Vydáno: 2018-03-15

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BS EN 62047-14:2012
Semiconductor devices. Micro-electromechanical devices Forming limit measuring method of metallic film materials

Vydáno: 2012-05-31

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BS EN 62047-3:2006
Semiconductor devices. Micro-electromechanical devices Thin film standard test piece for tensile testing

Vydáno: 2006-11-30

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BS EN 62047-16:2015
Semiconductor devices. Micro-electromechanical devices Test methods for determining residual stresses of MEMS films. Wafer curvature and cantilever beam deflection methods

Vydáno: 2015-07-31

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151 results

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