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BS EN 62047-18:2013
Semiconductor devices. Micro-electromechanical devices Bend testing methods of thin film materials

Vydáno: 2013-10-31

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BS EN 60747-16-5:2013+A1:2020
Semiconductor devices Microwave integrated circuits. Oscillators

Vydáno: 2020-09-24

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BS IEC 60747-18-3:2019
Semiconductor devices Semiconductor bio sensors. Fluid flow characteristics of lens-free CMOS photonic array sensor package modules with fluidic system

Vydáno: 2020-01-14

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BS IEC 60747-5-9:2019
Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of the internal quantum efficiency based on the temperature-dependent electroluminescence

Vydáno: 2020-01-14

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BS IEC 63068-2:2019
Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices Test method for defects using optical inspection

Vydáno: 2019-02-08

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BS EN 61967-2:2005
Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz Measurement of radiated emissions. TEM cell and wideband TEM cell method

Vydáno: 2006-01-23

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BS EN 62047-22:2014
Semiconductor devices. Micro-electromechanical devices Electromechanical tensile test method for conductive thin films on flexible substrates

Vydáno: 2014-10-31

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BS EN IEC 63287-2:2023
Semiconductor devices. Guidelines for reliability qualification plans Concept of mission profile

Vydáno: 2023-05-23

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BS IEC 62047-44:2024
Semiconductor devices. Micro-electromechanical devices Test methods for dynamic performances of MEMS resonant electric-field-sensitive devices

Vydáno: 2024-02-29

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24/30488096 DC
BS EN IEC 62031 LED modules. Safety requirements

Vydáno: 2024-04-12

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BS EN IEC 60747-16-9:2024
Semiconductor devices Microwave integrated circuits. Phase shifters

Vydáno: 2024-11-20

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BS IEC 60747-5-14:2022
Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of the surface temperature based on the thermoreflectance method

Vydáno: 2024-09-26

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151 results

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