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BS EN 62374:2007
Semiconductor devices. Time dependent dielectric breakdown (TDDB) test for gate dielectric films
Semiconductor devices. Time dependent dielectric breakdown (TDDB) test for gate dielectric films
Vydáno: 2008-10-31
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21/30436870 DC
BS IEC 60747-16-9. Semiconductor devices Part 16-9. Microwave integrated circuits. Phase shifters
BS IEC 60747-16-9. Semiconductor devices Part 16-9. Microwave integrated circuits. Phase shifters
Vydáno: 2021-09-03
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BS IEC 62047-40:2021
Semiconductor devices. Micro-electromechanical devices Test methods of micro-electromechanical inertial shock switch threshold
Semiconductor devices. Micro-electromechanical devices Test methods of micro-electromechanical inertial shock switch threshold
Vydáno: 2021-09-14
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BS EN 62047-18:2013
Semiconductor devices. Micro-electromechanical devices Bend testing methods of thin film materials
Semiconductor devices. Micro-electromechanical devices Bend testing methods of thin film materials
Vydáno: 2013-10-31
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BS EN 60747-16-5:2013+A1:2020
Semiconductor devices Microwave integrated circuits. Oscillators
Semiconductor devices Microwave integrated circuits. Oscillators
Vydáno: 2020-09-24
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BS EN 62047-22:2014
Semiconductor devices. Micro-electromechanical devices Electromechanical tensile test method for conductive thin films on flexible substrates
Semiconductor devices. Micro-electromechanical devices Electromechanical tensile test method for conductive thin films on flexible substrates
Vydáno: 2014-10-31
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