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24/30499672 DC
BS EN IEC 63550-2 Semiconductor devices - Neuromorphic devices Part 2: Evaluation method of linearity in memristor devices

Vydáno: 2024-08-30

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BS IEC 63068-4:2022
Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices Procedure for identifying and evaluating defects using a combined method of optical inspection and photoluminescence

Vydáno: 2022-09-07

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BS IEC 62951-9:2022
Semiconductor devices. Flexible and stretchable semiconductor devices Performance testing methods of one transistor and one resistor (1T1R) resistive memory cells

Vydáno: 2022-12-20

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BS IEC 62047-27:2017
Semiconductor devices. Micro-electromechanical devices Bond strength test for glass frit bonded structures using micro-chevron-tests (MCT)

Vydáno: 2020-07-22

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BS IEC 62047-30:2017
Semiconductor devices. Micro-electromechanical devices Measurement methods of electro-mechanical conversion characteristics of MEMS piezoelectric thin film

Vydáno: 2017-10-09

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BS EN 62047-5:2011
Semiconductor devices. Micro-electromechanical devices RF MEMS switches

Vydáno: 2013-04-30

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BS IEC 62951-4:2019
Semiconductor devices. Flexible and stretchable semiconductor devices Fatigue evaluation for flexible conductive thin film on the substrate for flexible semiconductor devices

Vydáno: 2019-03-05

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BS EN 61223-3-1:1999
Evaluation and routine testing in medical imaging departments Acceptance tests

Vydáno: 1999-08-15

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BS EN 62047-8:2011
Semiconductor devices. Micro-electromechanical devices Strip bending test method for tensile property measurement of thin films

Vydáno: 2011-06-30

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BS IEC 62047-38:2021
Semiconductor devices. Micro-electromechanical devices Test method for adhesion strength of metal powder paste in MEMS interconnection

Vydáno: 2021-07-07

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BS IEC 62830-8:2021
Semiconductor devices. Semiconductor devices for energy harvesting and generation Test and evaluation methods of flexible and stretchable supercapacitors for use in low power electronics

Vydáno: 2021-11-04

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18/30383935 DC
BS EN IEC 62047-37. Semiconductor devices. Micro-electromechanical devices Part 37. Environmental test methods of MEMS piezoelectric thin films for sensor application

Vydáno: 2018-12-04

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151 results

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