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BS EN 60444-8:2017
Measurement of quartz crystal unit parameters Test fixture for surface mounted quartz crystal units
Measurement of quartz crystal unit parameters Test fixture for surface mounted quartz crystal units
Vydáno: 2017-05-26
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58.75 €
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BS IEC 62047-34:2019
Semiconductor devices. Micro-electromechanical devices Test methods for MEMS piezoresistive pressure-sensitive device on wafer
Semiconductor devices. Micro-electromechanical devices Test methods for MEMS piezoresistive pressure-sensitive device on wafer
Vydáno: 2019-04-16
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BS IEC 62047-36:2019
Semiconductor devices. Micro-electromechanical devices Environmental and dielectric withstand test methods for MEMS piezoelectric thin films
Semiconductor devices. Micro-electromechanical devices Environmental and dielectric withstand test methods for MEMS piezoelectric thin films
Vydáno: 2019-04-24
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BS EN 60444-2:1997
Measurement of quartz crystal unit parameters Phase offset method for measurement of motional capacitance of quartz crystal units
Measurement of quartz crystal unit parameters Phase offset method for measurement of motional capacitance of quartz crystal units
Vydáno: 1993-09-15
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379.29 €
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37.93 €
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113.79 €
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379.29 €
BS EN 50324-1:2002
Piezoelectric properties of ceramic materials and components Terms and definitions
Piezoelectric properties of ceramic materials and components Terms and definitions
Vydáno: 2002-10-10
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BS EN 168100:1995
Harmonized system of quality assessment for electronic components. Sectional specification: quartz crystal units (capability approval)
Harmonized system of quality assessment for electronic components. Sectional specification: quartz crystal units (capability approval)
Vydáno: 1995-04-15
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27.27 €
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81.81 €
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BS EN 61837-3:2015
Surface mounted piezoelectric devices for frequency control and selection. Standard outlines and terminal lead connections Metal enclosures
Surface mounted piezoelectric devices for frequency control and selection. Standard outlines and terminal lead connections Metal enclosures
Vydáno: 2015-12-31
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BS EN IEC 62604-2:2022 - TC
Tracked Changes. Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality Guidelines for the use
Tracked Changes. Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality Guidelines for the use
Vydáno: 2022-12-01
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23/30468947 DC
BS EN 62276. Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods
BS EN 62276. Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods
Vydáno: 2023-01-30
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23/30472821 DC
BS EN IEC 60122-2. Quartz crystal units of assessed quality Part 2. Guide to the use
BS EN IEC 60122-2. Quartz crystal units of assessed quality Part 2. Guide to the use
Vydáno: 2023-04-12
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