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BS IEC 60748-23-3:2002
Semiconductor devices. Integrated circuits. Hybrid integrated circuits and film structures. Manufacturing line certification Manufacturers' self-audit checklist and report

Vydáno: 2002-06-18

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BS EN 62132-3:2007
Integrated circuits. Measurement of electromagnetic immunity, 150 kHz to 1 GHz Bulk current injection (BCI) method

Vydáno: 2007-11-30

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BS CECC 90115:1994
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: digital gate array integrated circuits

Vydáno: 1994-05-15

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BS CECC 90000:1991
Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits

Vydáno: 1991-03-29

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BS CECC 90105:1987
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: fusible link programmable bipolar read only memories, silicon monolithic integrated circuits

Vydáno: 1987-05-15

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BS EN 61967-6:2002+A1:2008
Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz Measurement of conducted emissions. Magnetic probe method

Vydáno: 2010-12-31

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BS CECC 90104:1990
Specification for harmonized system of quality assessment for electronic components. Family specification: C. MOS digital integrated circuits series 4000 B and 4000 UB

Vydáno: 1994-08-15

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BS CECC 63000:1990
Harmonized system of quality assessment for electronic components. Generic specification: film and hybrid integrated circuits

Vydáno: 1990-12-31

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BS EN IEC 61967-1:2019
Integrated circuits. Measurement of electromagnetic emissions General conditions and definitions

Vydáno: 2019-02-21

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19/30376552 DC
BS EN 62228-7. Integrated circuits. EMC evaluation of transceivers Part 7. CXPI transceivers

Vydáno: 2019-06-19

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BS QC 790303:1994
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Linear digital-to-analogue converters (DAC)

Vydáno: 1994-02-15

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BS CECC 90112:1987
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. MOS read/write dynamic memories silicon monolithic circuits

Vydáno: 1987-08-15

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132 results

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