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PD IEC/TS 62132-9:2014
Integrated circuits. Measurement of electromagnetic immunity Measurement of radiated immunity. Surface scan method

Vydáno: 2014-09-30

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BS CECC 90113:1987
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. MOS ultra-violet light erasable electrically programmable read only memories silicon monolithic circuits

Vydáno: 1987-05-15

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BS QC 790109:1992
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits.Family specification for HCMOS digital integrated circuits series 54/74 HC, 54/74 HCT, 54/74 HCU

Vydáno: 1992-05-15

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BS IEC 60748-2-12:2001
Semiconductor devices. Integrated circuits. Digital integrated circuits Blank detail specification for programmable logic devices (PLDs)

Vydáno: 2001-06-15

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BS EN 61943:1999
Integrated circuits. Manufacturing line approval application guideline

Vydáno: 1999-12-15

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BS IEC 60748-2:1997
Semiconductor devices. Integrated circuits Digital integrated circuits

Vydáno: 1998-04-15

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BS CECC 63100:1985
Harmonized system of quality assessment for electronic components: sectional specification: film and hybrid integrated circuits

Vydáno: 1985-01-31

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BS EN 62132-4:2006
Integrated circuits. Measurement of electromagnetic immunity. 150 kHz to 1 GHz Direct RF power injection method

Vydáno: 2006-07-31

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BS QC 790101:1992
Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Sectional specification for semiconductor integrated circuits excluding hybrid circuits. Internal visual examination for semiconductor integrated circuits excluding hybrid circuits

Vydáno: 1992-08-15

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BS QC 760000:1990
Harmonized system of quality assessment for electronic components. Film and hybrid film integrated circuits. Generic specification

Vydáno: 1990-04-30

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BS EN 62433-3:2017
EMC IC modelling Models of integrated Circuits for EMI behavioural simulation. Radiated emissions modelling (ICEM-RE)

Vydáno: 2017-12-13

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BS IEC 60748-23-4:2002
Semiconductor devices. Integrated circuits. Hybrid integrated circuits and film structures. Manufacturing line certification Blank detail specification

Vydáno: 2002-06-18

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131 results

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