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Homepage>BSI Standards>31 ELEKTRONIKA>31.200 Integrované obvody. Mikroelektronika

31.200 Integrované obvody. Mikroelektronika

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133 results
First page123...579101112Last page
BS EN 190107:1994
Specification for harmonized system of quality assessment for electronic components. Family specification. TTL FAST digital integrated circuits series 54 F, 74 F
Vydáno: 1987-09-15
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BS EN IEC 61967-8:2023
Integrated circuits. Measurement of electromagnetic emissions Measurement of radiated emissions. IC stripline method
Vydáno: 2023-06-15
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24/30500170 DC
BS EN IEC 62228-7 Integrated circuits. EMC evaluation of transceivers Part 7. CXPI transceivers
Vydáno: 2024-09-06
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BS CECC 90112:1987
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. MOS read/write dynamic memories silicon monolithic circuits
Vydáno: 1987-08-15
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BS QC 760100:1997
Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Sectional specification for film integrated circuits and hybrid film integrated circuits on the basis of the qualification approval procedures
Vydáno: 1997-08-15
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BS EN IEC 61967-1:2019
Integrated circuits. Measurement of electromagnetic emissions General conditions and definitions
Vydáno: 2019-02-21
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19/30376552 DC
BS EN 62228-7. Integrated circuits. EMC evaluation of transceivers Part 7. CXPI transceivers
Vydáno: 2019-06-19
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BS IEC 60748-23-3:2002
Semiconductor devices. Integrated circuits. Hybrid integrated circuits and film structures. Manufacturing line certification Manufacturers' self-audit checklist and report
Vydáno: 2002-06-18
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BS QC 790132:1992
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Bipolar monolithic digital integrated circuit gates (excluding uncommitted logic arrays)
Vydáno: 1992-01-31
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BS IEC 60748-11:2000
Semiconductor devices. Integrated circuits Sectional specification for semiconductor integrated circuits excluding hybrid circuits
Vydáno: 2011-07-31
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BS CECC 90105:1987
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: fusible link programmable bipolar read only memories, silicon monolithic integrated circuits
Vydáno: 1987-05-15
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BS EN 61967-6:2002+A1:2008
Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz Measurement of conducted emissions. Magnetic probe method
Vydáno: 2010-12-31
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133 results
First page123...579101112Last page