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BS EN ISO 16664:2017
Gas analysis. Handling of calibration gases and gas mixtures. Guidelines
Gas analysis. Handling of calibration gases and gas mixtures. Guidelines
Vydáno: 2017-08-11
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81.51 €
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BS ISO 11952:2019
Surface chemical analysis. Scanning-probe microscopy. Determination of geometric quantities using SPM: Calibration of measuring systems
Surface chemical analysis. Scanning-probe microscopy. Determination of geometric quantities using SPM: Calibration of measuring systems
Vydáno: 2019-05-31
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122.27 €
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31.87 €
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95.60 €
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BS 6337-1:1983
General methods of chemical analysis Method for determination of traces of sulphur compounds by reduction and titrimetry
General methods of chemical analysis Method for determination of traces of sulphur compounds by reduction and titrimetry
Vydáno: 1983-01-31
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BS EN 61207-7:2013
Expression of performance of gas analyzers Tuneable semiconductor laser gas analyzers
Expression of performance of gas analyzers Tuneable semiconductor laser gas analyzers
Vydáno: 2015-07-31
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81.51 €
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BS ISO 19229:2019 - TC
Tracked Changes. Gas analysis. Purity analysis and the treatment of purity data
Tracked Changes. Gas analysis. Purity analysis and the treatment of purity data
Vydáno: 2020-02-24
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BS ISO 14707:2021 - TC
Tracked Changes. Surface chemical analysis. Glow discharge optical emission spectrometry (GD-OES). Introduction to use
Tracked Changes. Surface chemical analysis. Glow discharge optical emission spectrometry (GD-OES). Introduction to use
Vydáno: 2021-06-14
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BS ISO 18115-2:2021 - TC
Tracked Changes. Surface chemical analysis. Vocabulary Terms used in scanning-probe microscopy
Tracked Changes. Surface chemical analysis. Vocabulary Terms used in scanning-probe microscopy
Vydáno: 2022-02-09
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BS EN IEC 61207-3:2019 - TC
Tracked Changes. Gas Analyzers. Expression of performance Paramagnetic oxygen analysers
Tracked Changes. Gas Analyzers. Expression of performance Paramagnetic oxygen analysers
Vydáno: 2020-02-24
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PD ISO/TR 15969:2021 - TC
Tracked Changes. Surface chemical analysis. Depth profiling. Measurement of sputtered depth
Tracked Changes. Surface chemical analysis. Depth profiling. Measurement of sputtered depth
Vydáno: 2021-06-21
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BS ISO 11775:2015
Surface chemical analysis. Scanning-probe microscopy. Determination of cantilever normal spring constants
Surface chemical analysis. Scanning-probe microscopy. Determination of cantilever normal spring constants
Vydáno: 2015-10-31
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