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71.040.40 Chemická analýza
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BS ISO 16242:2011
Surface chemical analysis. Recording and reporting data in Auger electron spectroscopy (AES)
Surface chemical analysis. Recording and reporting data in Auger electron spectroscopy (AES)
Vydáno: 2011-12-31
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BS ISO 16243:2011
Surface chemical analysis. Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
Surface chemical analysis. Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
Vydáno: 2011-12-31
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BS ISO 16962:2017
Surface chemical analysis. Analysis of zinc- and/or aluminium-based metallic coatings by glow-discharge optical-emission spectrometry
Surface chemical analysis. Analysis of zinc- and/or aluminium-based metallic coatings by glow-discharge optical-emission spectrometry
Vydáno: 2017-03-31
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Anglicky Secure PDF
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74.66 €
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BS ISO 17560:2014
Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth profiling of boron in silicon
Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth profiling of boron in silicon
Vydáno: 2014-09-30
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BS ISO 17862:2022
Surface chemical analysis. Secondary ion mass spectrometry. Linearity of intensity scale in single ion counting time-of-flight mass analysers
Surface chemical analysis. Secondary ion mass spectrometry. Linearity of intensity scale in single ion counting time-of-flight mass analysers
Vydáno: 2022-10-31
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