Menu
0
Total price
0 €
PRICES include / exclude VAT
Homepage>IEC 60191-6-21:2010 - Mechanical standardization of semiconductor devices - Part 6-21: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Measuring methods for package dimensions of small outline packages (SOP)
sklademVydáno: 2010-08-30
IEC 60191-6-21:2010 - Mechanical standardization of semiconductor devices - Part 6-21: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Measuring methods for package dimensions of small outline packages (SOP)

IEC 60191-6-21:2010

Mechanical standardization of semiconductor devices - Part 6-21: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Measuring methods for package dimensions of small outline packages (SOP)

Normalisation mécanique des dispositifs à semiconducters - Partie 6-21: Règles générales pour la préparation des dessins d'encombrement des boîtiers pour dispositifs à semiconducteurs pour montage en surface - Méthodes de mesure pour les dimensions des boîtiers de faible encombrement (SOP)

Format
Availability
Price and currency
Anglicky/Francouzsky Hardcopy
skladem
90.19 €
Anglicky/Francouzsky PDF
Immediate download
90.19 €
Označení normy:IEC 60191-6-21:2010
Vydáno:2010-08-30
Jazyk:Anglicky/Francouzsky
DESCRIPTION

IEC 60191-6-21:2010

IEC 60191-6-21:2010 specifies methods to measure package dimensions of small outline packages (SOP), package outline form E in accordance to IEC 60191-4.