Menu
0
Total price
0 €
PRICES include / exclude VAT
Homepage>IEC 60191-6-3:2000 - Mechanical standardization of semiconductor devices - Part 6-3: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Measuring methods for package dimensions of quad flat packs (QFP)
sklademVydáno: 2000-09-29
IEC 60191-6-3:2000 - Mechanical standardization of semiconductor devices - Part 6-3: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Measuring methods for package dimensions of quad flat packs (QFP)

IEC 60191-6-3:2000

Mechanical standardization of semiconductor devices - Part 6-3: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Measuring methods for package dimensions of quad flat packs (QFP)

Normalisation mécanique des dispositifs à semiconducteurs - Partie 6-3: Règles générales pour la préparation des dessins d'encombrement des dispositifs à semiconducteurs à montage en surface - Méthodes de mesure pour les boîtiers plats quadrangulaires (QFP)

Format
Availability
Price and currency
Anglicky/Francouzsky Hardcopy
skladem
129.18 €
Anglicky/Francouzsky PDF
Immediate download
129.18 €
Označení normy:IEC 60191-6-3:2000
Vydáno:2000-09-29
Jazyk:Anglicky/Francouzsky
DESCRIPTION

IEC 60191-6-3:2000

IEC 60191-6-3:2000 stipulates a method for quad flat packs (QFP) measuring dimensions which are classified into Form E.