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Homepage>IEC 60444-2:1980 - Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units
sklademVydáno: 1980-01-01
IEC 60444-2:1980 - Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units

IEC 60444-2:1980

Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units

Mesure des paramètres des quartz piézoélectriques par la technique de phase nulle dans le circuit en pi. Deuxième partie: Méthode de décalage de phase pour la mesure de la capacité dynamique des quartz

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Označení normy:IEC 60444-2:1980
Vydáno:1980-01-01
Jazyk:Anglicky/Francouzsky
DESCRIPTION

IEC 60444-2:1980

Describes a method of measuring the motional capacitance of quartz crystal units in the frequency range 1 MHz to 125 MHz with a total measurement error of the order of 5%.

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