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Homepage>IEC 60747-18-1:2019 - Semiconductor devices - Part 18-1: Semiconductor bio sensors - Test method and data analysis for calibration of lens-free CMOS photonic array sensors
sklademVydáno: 2019-05-20
IEC 60747-18-1:2019 - Semiconductor devices - Part 18-1: Semiconductor bio sensors - Test method and data analysis for calibration of lens-free CMOS photonic array sensors

IEC 60747-18-1:2019

Semiconductor devices - Part 18-1: Semiconductor bio sensors - Test method and data analysis for calibration of lens-free CMOS photonic array sensors

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Označení normy:IEC 60747-18-1:2019
Vydáno:2019-05-20
Jazyk:Anglicky
DESCRIPTION

IEC 60747-18-1:2019

IEC 60747-18-1:2019 (E) specifies the test methods and data analysis for the calibration of lens-free CMOS photonic array sensors. This document includes the test conditions of each process, configuration of lens-free CMOS photonic array sensors, statistical analysis of test data, calibration for planarization and linearity, and test reports.

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